Checking the Paths to Identify Mutant Application on Embedded Systems

Ahmadou Al Khary Séré, Julien Iguchi-Cartigny, Jean-Louis Lanet. Checking the Paths to Identify Mutant Application on Embedded Systems. In Tai-Hoon Kim, Young Hoon Lee, Byeong Ho Kang, Dominik Slezak, editors, Future Generation Information Technology - Second International Conference, FGIT 2010, Jeju Island, Korea, December 13-15, 2010. Proceedings. Volume 6485 of Lecture Notes in Computer Science, pages 459-468, Springer, 2010. [doi]

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