Ayssar Serhan, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir. Low-cost EVM built-in test of RF transceivers. In 9th International Design and Test Symposium, IDT 2014, Algeries, Algeria, December 16-18, 2014. pages 51-54, IEEE, 2014. [doi]
@inproceedings{SerhanASM14,
title = {Low-cost EVM built-in test of RF transceivers},
author = {Ayssar Serhan and Louay Abdallah and Haralampos-G. D. Stratigopoulos and Salvador Mir},
year = {2014},
doi = {10.1109/IDT.2014.7038586},
url = {http://doi.ieeecomputersociety.org/10.1109/IDT.2014.7038586},
researchr = {https://researchr.org/publication/SerhanASM14},
cites = {0},
citedby = {0},
pages = {51-54},
booktitle = {9th International Design and Test Symposium, IDT 2014, Algeries, Algeria, December 16-18, 2014},
publisher = {IEEE},
isbn = {978-1-4799-8200-4},
}