Bharath Seshadri, Xiaoming Yu, Srikanth Venkataraman. Accelerating Diagnostic Fault Simulation Using Z-diagnosis and Concurrent Equivalence Identification. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 380-385, IEEE Computer Society, 2006. [doi]
@inproceedings{SeshadriYV06,
title = {Accelerating Diagnostic Fault Simulation Using Z-diagnosis and Concurrent Equivalence Identification},
author = {Bharath Seshadri and Xiaoming Yu and Srikanth Venkataraman},
year = {2006},
doi = {10.1109/VTS.2006.14},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.14},
tags = {diagnostics},
researchr = {https://researchr.org/publication/SeshadriYV06},
cites = {0},
citedby = {0},
pages = {380-385},
booktitle = {24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2514-8},
}