Bharath Seshadri, Xiaoming Yu, Srikanth Venkataraman. Accelerating Diagnostic Fault Simulation Using Z-diagnosis and Concurrent Equivalence Identification. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 380-385, IEEE Computer Society, 2006. [doi]
Abstract is missing.