Predicting Fault Coverage from Probabilistic Testability

Sharad C. Seth. Predicting Fault Coverage from Probabilistic Testability. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 803-807, IEEE Computer Society, 1985.

Authors

Sharad C. Seth

This author has not been identified. Look up 'Sharad C. Seth' in Google