D. Seyringer, Martin Sagmeister, A. Maese-Novo, Moritz Eggeling, E. Rank, J. Edlinger, Paul Muellner, Rainer Hainberger, W. Drexler, Jochen Kraft, G. Koppitsch, G. Meinhardt, Marko Vlaskovic, H. Zimmermann. Compact and High-Resolution 256-Channel Silicon Nitride Based AWG-Spectrometer for OCT on a Chip. In 21st International Conference on Transparent Optical Networks, ICTON 2019, Angers, France, July 9-13, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.