Amanda Sgroi, Kevin W. Bowyer, Patrick J. Flynn, P. Jonathon Phillips. SNoW: Understanding the causes of strong, neutral, and weak face impostor pairs. In IEEE Sixth International Conference on Biometrics: Theory, Applications and Systems, BTAS 2013, Arlington, VA, USA, September 29 - October 2, 2013. pages 1-8, IEEE, 2013. [doi]
@inproceedings{SgroiBFP13,
title = {SNoW: Understanding the causes of strong, neutral, and weak face impostor pairs},
author = {Amanda Sgroi and Kevin W. Bowyer and Patrick J. Flynn and P. Jonathon Phillips},
year = {2013},
doi = {10.1109/BTAS.2013.6712697},
url = {http://dx.doi.org/10.1109/BTAS.2013.6712697},
researchr = {https://researchr.org/publication/SgroiBFP13},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {IEEE Sixth International Conference on Biometrics: Theory, Applications and Systems, BTAS 2013, Arlington, VA, USA, September 29 - October 2, 2013},
publisher = {IEEE},
}