Amanda Sgroi, Kevin W. Bowyer, Patrick J. Flynn, P. Jonathon Phillips. SNoW: Understanding the causes of strong, neutral, and weak face impostor pairs. In IEEE Sixth International Conference on Biometrics: Theory, Applications and Systems, BTAS 2013, Arlington, VA, USA, September 29 - October 2, 2013. pages 1-8, IEEE, 2013. [doi]
Abstract is missing.