On code coverage measurement for Verilog-A

Yuan-Bin Sha, Mu-Shun Matt Lee, Chien-Nan Jimmy Liu. On code coverage measurement for Verilog-A. In Ninth IEEE International High-Level Design Validation and Test Workshop 2004, Sonoma Valley, CA, USA, November 10-12, 2004. pages 115-120, IEEE Computer Society, 2004. [doi]

Authors

Yuan-Bin Sha

This author has not been identified. Look up 'Yuan-Bin Sha' in Google

Mu-Shun Matt Lee

This author has not been identified. Look up 'Mu-Shun Matt Lee' in Google

Chien-Nan Jimmy Liu

This author has not been identified. Look up 'Chien-Nan Jimmy Liu' in Google