Yuan-Bin Sha, Mu-Shun Matt Lee, Chien-Nan Jimmy Liu. On code coverage measurement for Verilog-A. In Ninth IEEE International High-Level Design Validation and Test Workshop 2004, Sonoma Valley, CA, USA, November 10-12, 2004. pages 115-120, IEEE Computer Society, 2004. [doi]
@inproceedings{ShaLL04,
title = {On code coverage measurement for Verilog-A},
author = {Yuan-Bin Sha and Mu-Shun Matt Lee and Chien-Nan Jimmy Liu},
year = {2004},
doi = {10.1109/HLDVT.2004.1431251},
url = {http://doi.ieeecomputersociety.org/10.1109/HLDVT.2004.1431251},
researchr = {https://researchr.org/publication/ShaLL04},
cites = {0},
citedby = {0},
pages = {115-120},
booktitle = {Ninth IEEE International High-Level Design Validation and Test Workshop 2004, Sonoma Valley, CA, USA, November 10-12, 2004},
publisher = {IEEE Computer Society},
isbn = {0-7803-8714-7},
}