Bassam Shaer. Concurrent Pseudo-Exhaustive Testing of Combinational VLSI Circuits. In 2004 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2004), Emerging Trends in VLSI Systems Design, 19-20 February 2004, Lafayette, LA, USA. pages 289-290, IEEE Computer Society, 2004. [doi]
@inproceedings{Shaer04,
title = {Concurrent Pseudo-Exhaustive Testing of Combinational VLSI Circuits},
author = {Bassam Shaer},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/isvlsi/2004/2097/00/20970289abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/Shaer04},
cites = {0},
citedby = {0},
pages = {289-290},
booktitle = {2004 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2004), Emerging Trends in VLSI Systems Design, 19-20 February 2004, Lafayette, LA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2097-9},
}