Bassam Shaer, Sami A. Al-Arian, David L. Landis. Pseudo-Exhaustive Testing of Sequential Circuits. In 9th Great Lakes Symposium on VLSI (GLS-VLSI 99), 4-6 March 1999, Ann Arbor, MI, USA. pages 109, IEEE Computer Society, 1999. [doi]
Abstract is missing.