Ankitchandra Shah, Hamid Mahmoodi. Thermal estimation for accurate estimation of impact of BTI aging effects on nano-scale SRAM circuits. In Thomas Büchner, Ramalingam Sridhar, Andrew Marshall, Norbert Schuhmann, editors, Annual IEEE International SoC Conference, SoCC 2010, September 27-29, 2010, Las Vegas, NV, USA, Proceedings. pages 230-235, IEEE, 2010. [doi]
@inproceedings{ShahM10-1,
title = {Thermal estimation for accurate estimation of impact of BTI aging effects on nano-scale SRAM circuits},
author = {Ankitchandra Shah and Hamid Mahmoodi},
year = {2010},
doi = {10.1109/SOCC.2010.5784741},
url = {http://dx.doi.org/10.1109/SOCC.2010.5784741},
researchr = {https://researchr.org/publication/ShahM10-1},
cites = {0},
citedby = {0},
pages = {230-235},
booktitle = {Annual IEEE International SoC Conference, SoCC 2010, September 27-29, 2010, Las Vegas, NV, USA, Proceedings},
editor = {Thomas Büchner and Ramalingam Sridhar and Andrew Marshall and Norbert Schuhmann},
publisher = {IEEE},
isbn = {978-1-4244-6682-5},
}