Ankitchandra Shah, Hamid Mahmoodi. Thermal estimation for accurate estimation of impact of BTI aging effects on nano-scale SRAM circuits. In Thomas Büchner, Ramalingam Sridhar, Andrew Marshall, Norbert Schuhmann, editors, Annual IEEE International SoC Conference, SoCC 2010, September 27-29, 2010, Las Vegas, NV, USA, Proceedings. pages 230-235, IEEE, 2010. [doi]
Abstract is missing.