Enhancement of the Illinois Scan Architecture for Use with Multiple Scan Inputs

Mihir A. Shah, Janak H. Patel. Enhancement of the Illinois Scan Architecture for Use with Multiple Scan Inputs. In 2004 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2004), Emerging Trends in VLSI Systems Design, 19-20 February 2004, Lafayette, LA, USA. pages 167-172, IEEE Computer Society, 2004. [doi]

Abstract

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