Ambika Prasad Shah, Santosh Kumar Vishvakarma, Michael Hübner. Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace Applications. J. Electronic Testing, 36(2):255-269, 2020. [doi]
@article{ShahVH20,
title = {Soft Error Hardened Asymmetric 10T SRAM Cell for Aerospace Applications},
author = {Ambika Prasad Shah and Santosh Kumar Vishvakarma and Michael Hübner},
year = {2020},
doi = {10.1007/s10836-020-05864-7},
url = {https://doi.org/10.1007/s10836-020-05864-7},
researchr = {https://researchr.org/publication/ShahVH20},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {36},
number = {2},
pages = {255-269},
}