Probabilistic optimal tree hopping for RFID identification

Muhammad Shahzad, Alex X. Liu. Probabilistic optimal tree hopping for RFID identification. In Mor Harchol-Balter, John R. Douceur, Jun Xu, editors, ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS '13, Pittsburgh, PA, USA, June 17-21, 2013. pages 293-304, ACM, 2013. [doi]

Authors

Muhammad Shahzad

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Alex X. Liu

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