Muhammad Shahzad, Alex X. Liu. Probabilistic optimal tree hopping for RFID identification. In Mor Harchol-Balter, John R. Douceur, Jun Xu, editors, ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS '13, Pittsburgh, PA, USA, June 17-21, 2013. pages 293-304, ACM, 2013. [doi]
@inproceedings{ShahzadL13, title = {Probabilistic optimal tree hopping for RFID identification}, author = {Muhammad Shahzad and Alex X. Liu}, year = {2013}, doi = {10.1145/2465529.2465549}, url = {http://doi.acm.org/10.1145/2465529.2465549}, researchr = {https://researchr.org/publication/ShahzadL13}, cites = {0}, citedby = {0}, pages = {293-304}, booktitle = {ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS '13, Pittsburgh, PA, USA, June 17-21, 2013}, editor = {Mor Harchol-Balter and John R. Douceur and Jun Xu}, publisher = {ACM}, isbn = {978-1-4503-1900-3}, }