Manar N. Shaker, Ahmed H. Madian, Mohamed B. Abdelhalim, Sherif H. Amer, Ahmed S. Emara, H. H. Amer. Effect of open faults in FPGA switch matrices on fault detection mechanisms. In 28th International Conference on Microelectronics, ICM 2016, Giza, Egypt, December 17-20, 2016. pages 233-236, IEEE, 2016. [doi]
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