Effect of open faults in FPGA switch matrices on fault detection mechanisms

Manar N. Shaker, Ahmed H. Madian, Mohamed B. Abdelhalim, Sherif H. Amer, Ahmed S. Emara, H. H. Amer. Effect of open faults in FPGA switch matrices on fault detection mechanisms. In 28th International Conference on Microelectronics, ICM 2016, Giza, Egypt, December 17-20, 2016. pages 233-236, IEEE, 2016. [doi]

Abstract

Abstract is missing.