Optimal and near-optimal algorithms for multiple fault diagnosis with unreliable tests - researchr publication authors

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Mojdeh Shakeri, Krishna R. Pattipati, Vijay V. Raghavan, Ann Patterson-Hine. Optimal and near-optimal algorithms for multiple fault diagnosis with unreliable tests. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 28(3):431-440, 1998. [doi]

This author has not been identified. Look up 'Mojdeh Shakeri' in GoogleThis author has not been identified. Look up 'Krishna R. Pattipati' in GoogleThis author has not been identified. Look up 'Vijay V. Raghavan' in GoogleThis author has not been identified. Look up 'Ann Patterson-Hine' in Google

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