Mojdeh Shakeri, Krishna R. Pattipati, Vijay V. Raghavan, Ann Patterson-Hine. Optimal and near-optimal algorithms for multiple fault diagnosis with unreliable tests. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 28(3):431-440, 1998. [doi]
@article{ShakeriPRP98,
title = {Optimal and near-optimal algorithms for multiple fault diagnosis with unreliable tests},
author = {Mojdeh Shakeri and Krishna R. Pattipati and Vijay V. Raghavan and Ann Patterson-Hine},
year = {1998},
doi = {10.1109/5326.704583},
url = {http://dx.doi.org/10.1109/5326.704583},
researchr = {https://researchr.org/publication/ShakeriPRP98},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Systems, Man, and Cybernetics, Part A},
volume = {28},
number = {3},
pages = {431-440},
}