Using ECC and redundancy to minimize vmin induced yield loss in 6T SRAM arrays - researchr publication authors

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Gururaj Shamanna, Raja Gaurav, Y. K. Raghavendra, Percy Marfatia, Bhunesh S. Kshatri. Using ECC and redundancy to minimize vmin induced yield loss in 6T SRAM arrays. In IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012. pages 1-4, IEEE, 2012. [doi]

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