Process technology and design parameter impact on SRAM Bit-Cell Sleep effectiveness

Gururaj Shamanna, Bhunesh S. Kshatri, Raja Gaurav, Y. S. Tew, P. Marfatia, Y. Raghavendra, V. Naik. Process technology and design parameter impact on SRAM Bit-Cell Sleep effectiveness. In Thomas Büchner, Ramalingam Sridhar, Andrew Marshall, Norbert Schuhmann, editors, Annual IEEE International SoC Conference, SoCC 2010, September 27-29, 2010, Las Vegas, NV, USA, Proceedings. pages 313-316, IEEE, 2010. [doi]

@inproceedings{ShamannaKGTMRN10,
  title = {Process technology and design parameter impact on SRAM Bit-Cell Sleep effectiveness},
  author = {Gururaj Shamanna and Bhunesh S. Kshatri and Raja Gaurav and Y. S. Tew and P. Marfatia and Y. Raghavendra and V. Naik},
  year = {2010},
  doi = {10.1109/SOCC.2010.5784653},
  url = {http://dx.doi.org/10.1109/SOCC.2010.5784653},
  researchr = {https://researchr.org/publication/ShamannaKGTMRN10},
  cites = {0},
  citedby = {0},
  pages = {313-316},
  booktitle = {Annual IEEE International SoC Conference, SoCC 2010, September 27-29, 2010, Las Vegas, NV, USA, Proceedings},
  editor = {Thomas Büchner and Ramalingam Sridhar and Andrew Marshall and Norbert Schuhmann},
  publisher = {IEEE},
  isbn = {978-1-4244-6682-5},
}