Process technology and design parameter impact on SRAM Bit-Cell Sleep effectiveness

Gururaj Shamanna, Bhunesh S. Kshatri, Raja Gaurav, Y. S. Tew, P. Marfatia, Y. Raghavendra, V. Naik. Process technology and design parameter impact on SRAM Bit-Cell Sleep effectiveness. In Thomas B├╝chner, Ramalingam Sridhar, Andrew Marshall, Norbert Schuhmann, editors, Annual IEEE International SoC Conference, SoCC 2010, September 27-29, 2010, Las Vegas, NV, USA, Proceedings. pages 313-316, IEEE, 2010. [doi]

Abstract

Abstract is missing.