Intensity-Based Wasserstein Distance As A Loss Measure For Unsupervised Deformable Deep Registration - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Roozbeh Shams, William Le, Adrien Weihs, Samuel Kadoury. Intensity-Based Wasserstein Distance As A Loss Measure For Unsupervised Deformable Deep Registration. In 18th IEEE International Symposium on Biomedical Imaging, ISBI 2021, Nice, France, April 13-16, 2021. pages 252-256, IEEE, 2021. [doi]

This author has not been identified. Look up 'Roozbeh Shams' in GoogleThis author has not been identified. Look up 'William Le' in GoogleThis author has not been identified. Look up 'Adrien Weihs' in GoogleThis author has not been identified. Look up 'Samuel Kadoury' in Google

runs on WebDSL