Roozbeh Shams, William Le, Adrien Weihs, Samuel Kadoury. Intensity-Based Wasserstein Distance As A Loss Measure For Unsupervised Deformable Deep Registration. In 18th IEEE International Symposium on Biomedical Imaging, ISBI 2021, Nice, France, April 13-16, 2021. pages 252-256, IEEE, 2021. [doi]
@inproceedings{ShamsLWK21,
title = {Intensity-Based Wasserstein Distance As A Loss Measure For Unsupervised Deformable Deep Registration},
author = {Roozbeh Shams and William Le and Adrien Weihs and Samuel Kadoury},
year = {2021},
doi = {10.1109/ISBI48211.2021.9433818},
url = {https://doi.org/10.1109/ISBI48211.2021.9433818},
researchr = {https://researchr.org/publication/ShamsLWK21},
cites = {0},
citedby = {0},
pages = {252-256},
booktitle = {18th IEEE International Symposium on Biomedical Imaging, ISBI 2021, Nice, France, April 13-16, 2021},
publisher = {IEEE},
isbn = {978-1-6654-1246-9},
}