Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy - researchr publication authors

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Saeed Shamshiri, Kwang-Ting Cheng. Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 194-199, IEEE Computer Society, 2010. [doi]

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