Saeed Shamshiri, Kwang-Ting Cheng. Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 194-199, IEEE Computer Society, 2010. [doi]
@inproceedings{ShamshiriC10,
title = {Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy},
author = {Saeed Shamshiri and Kwang-Ting Cheng},
year = {2010},
doi = {10.1109/VTS.2010.5469579},
url = {http://dx.doi.org/10.1109/VTS.2010.5469579},
tags = {redundancy, modeling},
researchr = {https://researchr.org/publication/ShamshiriC10},
cites = {0},
citedby = {0},
pages = {194-199},
booktitle = {28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-6648-1},
}