Xianzhou Shao, Junshuai Chai, Min Liao, Jiahui Duan, Fengbin Tian, Xiaoyu Ke, Xiaoqing Sun, Hao Xu, Jinjuan Xiang, Xiaolei Wang, Wenwu Wang 0006. Comprehensive Study of Endurance Fatigue in the Scaled Si FeFET by in-situ Vth Measurement and Endurance Enhancement Strategy. In IEEE International Memory Workshop, IMW 2023, Monterey, CA, USA, May 21-24, 2023. pages 1-4, IEEE, 2023. [doi]
@inproceedings{ShaoCLDTKSXXW023,
title = {Comprehensive Study of Endurance Fatigue in the Scaled Si FeFET by in-situ Vth Measurement and Endurance Enhancement Strategy},
author = {Xianzhou Shao and Junshuai Chai and Min Liao and Jiahui Duan and Fengbin Tian and Xiaoyu Ke and Xiaoqing Sun and Hao Xu and Jinjuan Xiang and Xiaolei Wang and Wenwu Wang 0006},
year = {2023},
doi = {10.1109/IMW56887.2023.10145966},
url = {https://doi.org/10.1109/IMW56887.2023.10145966},
researchr = {https://researchr.org/publication/ShaoCLDTKSXXW023},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Memory Workshop, IMW 2023, Monterey, CA, USA, May 21-24, 2023},
publisher = {IEEE},
isbn = {978-1-6654-7459-7},
}