Cuiping Shao, Huiyun Li, Guanghua Du, Jinlong Guo, Zujia Miao, Hongmei Zhu. Fault Tolerance Method for Memory Based on Inner Product Similarity and Experimental Study on Heavy Ion Irradiation. Journal of Circuits, Systems, and Computers, 31(18), December 2022. [doi]
@article{ShaoLDGMZ22,
title = {Fault Tolerance Method for Memory Based on Inner Product Similarity and Experimental Study on Heavy Ion Irradiation},
author = {Cuiping Shao and Huiyun Li and Guanghua Du and Jinlong Guo and Zujia Miao and Hongmei Zhu},
year = {2022},
month = {December},
doi = {10.1142/S0218126622400060},
url = {https://doi.org/10.1142/S0218126622400060},
researchr = {https://researchr.org/publication/ShaoLDGMZ22},
cites = {0},
citedby = {0},
journal = {Journal of Circuits, Systems, and Computers},
volume = {31},
number = {18},
}