Fault Tolerance Method for Memory Based on Inner Product Similarity and Experimental Study on Heavy Ion Irradiation - researchr publication related

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Cuiping Shao, Huiyun Li, Guanghua Du, Jinlong Guo, Zujia Miao, Hongmei Zhu. Fault Tolerance Method for Memory Based on Inner Product Similarity and Experimental Study on Heavy Ion Irradiation. Journal of Circuits, Systems, and Computers, 31(18), December 2022. [doi]

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