Edge patterns extracted from natural images and their statistics for reduced-reference image quality assessment

Wenting Shao, Xuanqin Mou. Edge patterns extracted from natural images and their statistics for reduced-reference image quality assessment. In Nitin Sampat, Sebastiano Battiato, editors, Digital Photography IX, part of the IS&T-SPIE Electronic Imaging Symposium, Burlingame, California, USA, February 3, 2013, Proceedings. Volume 8660 of SPIE Proceedings, SPIE/IS&T, 2013. [doi]

Abstract

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