Accurate Prediction of Substrate Parasitics in Heavily Doped CMOS Processes Using a Calibrated Boundary Element Solver - researchr publication authors

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Ajit Sharma, P. Birrer, S. K. Arunachalam, Chenggang Xu, Terri S. Fiez, Kartikeya Mayaram. Accurate Prediction of Substrate Parasitics in Heavily Doped CMOS Processes Using a Calibrated Boundary Element Solver. IEEE Trans. VLSI Syst., 13(7):843-851, 2005. [doi]

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