Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. Malaiya. X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 180-185, IEEE Computer Society, 2006. [doi]
Abstract is missing.