Aaryan Sharma, Deepak Kumar, Vinay Kukreja. Boosting Crop Yield and Quality: Deep Learning-Based Multi-Classification of Wheat Eye Spot Disease. In 14th International Conference on Computing Communication and Networking Technologies, ICCCNT 2023, Delhi, India, July 6-8, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.