Bounding Circuit Delay by Testing a Very Small Subset of Paths

Manish Sharma, Janak H. Patel. Bounding Circuit Delay by Testing a Very Small Subset of Paths. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 333-342, IEEE Computer Society, 2000. [doi]

Abstract

Abstract is missing.