Manvi Sharma, Mayank Kumar Rai, Rajesh Khanna. Dielectric surface roughness scattering induced crosstalk performance of coupled MCB interconnects. Microelectronics Journal, 114:105084, 2021. [doi]
@article{SharmaRK21,
title = {Dielectric surface roughness scattering induced crosstalk performance of coupled MCB interconnects},
author = {Manvi Sharma and Mayank Kumar Rai and Rajesh Khanna},
year = {2021},
doi = {10.1016/j.mejo.2021.105084},
url = {https://doi.org/10.1016/j.mejo.2021.105084},
researchr = {https://researchr.org/publication/SharmaRK21},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {114},
pages = {105084},
}