Donald B. Shaw, Dhamin Al-Khalili, Come Rozon. Automatic generation of defect injectable VHDL fault models for ASIC standard cell libraries. Integration, 39(4):382-406, 2006. [doi]
@article{ShawAR06,
title = {Automatic generation of defect injectable VHDL fault models for ASIC standard cell libraries},
author = {Donald B. Shaw and Dhamin Al-Khalili and Come Rozon},
year = {2006},
doi = {10.1016/j.vlsi.2005.08.002},
url = {http://dx.doi.org/10.1016/j.vlsi.2005.08.002},
researchr = {https://researchr.org/publication/ShawAR06},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {39},
number = {4},
pages = {382-406},
}