A. Shaw, T. J. Whittles, I. Z. Mitrovic, J. D. Jin, J. S. Wrench, D. Hesp, V. R. Dhanak, P. R. Chalker, Steve Hall. Physical and electrical characterization of Mg-doped ZnO thin-film transistors. In 45th European Solid State Device Research Conference, ESSDERC 2015, Graz, Austria, September 14-18, 2015. pages 206-209, IEEE, 2015. [doi]
@inproceedings{ShawWMJWHDCH15,
title = {Physical and electrical characterization of Mg-doped ZnO thin-film transistors},
author = {A. Shaw and T. J. Whittles and I. Z. Mitrovic and J. D. Jin and J. S. Wrench and D. Hesp and V. R. Dhanak and P. R. Chalker and Steve Hall},
year = {2015},
doi = {10.1109/ESSDERC.2015.7324751},
url = {http://dx.doi.org/10.1109/ESSDERC.2015.7324751},
researchr = {https://researchr.org/publication/ShawWMJWHDCH15},
cites = {0},
citedby = {0},
pages = {206-209},
booktitle = {45th European Solid State Device Research Conference, ESSDERC 2015, Graz, Austria, September 14-18, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7135-3},
}