SEU tolerant robust memory cell design - researchr publication authors

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Mohammed Shayan, Virendra Singh, Adit D. Singh, Masahiro Fujita. SEU tolerant robust memory cell design. In 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012. pages 13-18, IEEE Computer Society, 2012. [doi]

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