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Two-dimensional CMOS image sensor characterization

I. Shcherback, R. Segal, Alexander Belenky, Orly Yadid-Pecht. Two-dimensional CMOS image sensor characterization. In International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece. IEEE, 2006. [doi]

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