B. H. Shekar, R. K. Bharathi, Josef Kittler, Yury Vizilter, Leonid Mestetskiy. Grid structured morphological pattern spectrum for off-line signature verification. In International Conference on Biometrics, ICB 2015, Phuket, Thailand, 19-22 May, 2015. pages 430-435, IEEE, 2015. [doi]
@inproceedings{ShekarBKVM15,
title = {Grid structured morphological pattern spectrum for off-line signature verification},
author = {B. H. Shekar and R. K. Bharathi and Josef Kittler and Yury Vizilter and Leonid Mestetskiy},
year = {2015},
doi = {10.1109/ICB.2015.7139106},
url = {http://dx.doi.org/10.1109/ICB.2015.7139106},
researchr = {https://researchr.org/publication/ShekarBKVM15},
cites = {0},
citedby = {0},
pages = {430-435},
booktitle = {International Conference on Biometrics, ICB 2015, Phuket, Thailand, 19-22 May, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7824-3},
}