B. H. Shekar, R. K. Bharathi, Josef Kittler, Yury Vizilter, Leonid Mestetskiy. Grid structured morphological pattern spectrum for off-line signature verification. In International Conference on Biometrics, ICB 2015, Phuket, Thailand, 19-22 May, 2015. pages 430-435, IEEE, 2015. [doi]
Abstract is missing.