A Framework for Scalable Analysis and Design of System-wide Graceful Degradation in Distributed Embedded Systems

Charles P. Shelton, Philip Koopman, William Nace. A Framework for Scalable Analysis and Design of System-wide Graceful Degradation in Distributed Embedded Systems. In 8th IEEE International Workshop on Object-Oriented Real-Time Dependable Systems (WORDS 2003), 15-17 January 2003, Guadalajara, Mexico. pages 156-163, IEEE Computer Society, 2003. [doi]

Abstract

Abstract is missing.