Tianhong Shen, Yanan Sun 0003, Weifeng He, Zhi Li, Weiyi Liu, Zhezhi He, Li Jiang 0002. A Ternary Memristive Logic-in-Memory Design for Fast Data Scan. In 2021 IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2021, Zhuhai, China, November 24-26, 2021. pages 183-184, IEEE, 2021. [doi]
Abstract is missing.