Jian Shen, Jacob A. Abraham. Native mode functional test generation for processors with applications to self test and design validation. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 990-999, IEEE Computer Society, 1998. [doi]
@inproceedings{ShenA98:0,
title = {Native mode functional test generation for processors with applications to self test and design validation},
author = {Jian Shen and Jacob A. Abraham},
year = {1998},
url = {http://www.computer.org/proceedings/itc/5093/50930990abs.htm},
tags = {testing, design},
researchr = {https://researchr.org/publication/ShenA98%3A0},
cites = {0},
citedby = {0},
pages = {990-999},
booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998},
publisher = {IEEE Computer Society},
isbn = {0-7803-5093-6},
}