Jie Shen, Vela Diego, David Yoon. Removal of Surface Artifacts of Material Volume Data with Defects. In Beniamino Murgante, Osvaldo Gervasi, Andrés Iglesias, David Taniar, Bernady O. Apduhan, editors, Computational Science and Its Applications - ICCSA 2011 - International Conference, Santander, Spain, June 20-23, 2011. Proceedings, Part II. Volume 6783 of Lecture Notes in Computer Science, pages 624-634, Springer, 2011. [doi]
Abstract is missing.