Detection of multiple faults in CMOS circuits using a behavioral approach

Yi-Nan Shen, Fabrizio Lombardi. Detection of multiple faults in CMOS circuits using a behavioral approach. In 10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA. pages 188-193, IEEE, 1992. [doi]

Authors

Yi-Nan Shen

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Fabrizio Lombardi

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