Detection of multiple faults in CMOS circuits using a behavioral approach

Yi-Nan Shen, Fabrizio Lombardi. Detection of multiple faults in CMOS circuits using a behavioral approach. In 10th IEEE VLSI Test Symposium (VTS'92), 7-9 Apr 1992, Atlantic City, NJ, USA. pages 188-193, IEEE, 1992. [doi]

Abstract

Abstract is missing.